Dr. Griselda Bonilla is the manager of the Materials and Reliability Sciences group at IBM’s TJ Watson Research Center in Yorktown Heights, NY, where she is responsible for extending IBM’s microelectronics technology and manufacturing leadership through innovations in materials, processes, and reliability methodology. Specifically, her work deals with a detailed understanding of the impact of scaling and material properties on reliability performance of semiconductor devices. Prior to this, she was the technical lead for the incorporation of next generation low-k dielectric and metallic barrier materials into the manufacturing process for making high performance microprocessors.
Griselda earned a B.S. Degree in Chemical Engineering from the University of Puerto Rico at Mayaguez, and as a GEM Fellow, a M.S. in Chemical Engineering from Purdue University, and a Ph.D. in Chemical Engineering from the University of Massachusetts Amherst in 2004. For her dissertation, directed by Profs. Michael Tsapatsis and Dion Vlachos, she developed a new methodology for the rational design of inorganic membranes with a desired orientation and microstructure by tailoring the individual crystal morphology. The first functional b-oriented MFI membranes were synthesized using this approach. In 2006, her dissertation was awarded the “Best PhD in Particle Technology” by the American Institute of Chemical Engineers. She has authored or coauthored over 40 papers and presentations, including a paper in Science. In addition, she has also been awarded 4 patents, and has a number of additional patents under review.